1.
Frontiers of Characterization and Metrology for Nanoelectronics
by Seiler, David G., Diebold, ...
ISBN: 9780735404410
2.
Characterization and Metrology for Ulsi Technology 2003 International Conference on Characte...
by Seiler, David G., Diebold, ...
ISBN: 9780735401525
List Price: $210.00
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Characterization and Metrology for Ulsi Technology 2000 International Conference
by Seiler, David G., Diebold, ...
ISBN: 9781563969676
List Price: $185.00
OUT OF STOCK
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Handbook of Silicon Semiconductor Metrology
by Diebold, Alain C.
ISBN: 9780367397166
List Price: $74.95